99-0076 Part with NSN 6625012873379 by Accelonix - Buy Now

Part Number:  99-0076
Alternate P/N:  990076
Manufacturer:  Accelonix
Item Name :  test set electronic
CAGE Code:  F8791
NIIN:  01-287-3379
INC Code:  77777
Country:  USA
NCB Code:  01

Thank you for taking an interest in Accelonix part number 99-0076, which is currently available for purchase today here on ASAP Aerospace. You have reached our Request for Quote (RFQ) page for this part number 99-0076, where we make it easy to secure competitive pricing and procurement options from our staff.

Part Number 99-0076 Details: 

Part number 99-0076 traces back to Accelonix (CAGE Code F8791), having been classified under NSN 6625012873379 and item name Test Set Electronic. With its NSN, this part number belongs to FSG 66 Instruments and Laboratory Equipment and FSC 6625 Electrical And Electronic Properties Measuring And Testing Instruments. Additional listing data derived from the NSN includes the NIIN 012873379, the INC 77777, and NCB code 01 (USA).

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Disclaimer: This is a quotation for the goods listed above. This quotation is meant as an estimate and does not reflect a final bill or invoice. All quotations are subject to change until acceptance by ASAP Semiconductor of a binding Purchase Order, and quotations may be withdrawn or revised at the sole discretion of ASAP Semiconductor. This quotation is subject to the ASAP Semiconductor Terms & Conditions available at https://www.asapsemi.com/customer-terms-conditions.aspx. All United States Government and Department of Defense bids are quoted as CAGE code 6RE77 from ASAP Semiconductor’s Anaheim, California facility. Any quotation from ASAP Semiconductor without 6RE77 is void.

Characteristics Data of NSN 6625-01-287-3379, 6625012873379

MRCCriteriaCharacteristic
TEXTGENERAL CHARACTERISTICS ITEM DESCRIPTIONFOR TESTING CAPACITORS FOR SHORTS,OPENS AND LEAKAGE FROM 0.001 MICRO F TO 25 F; TESTS RESISTANCE CIRCUITS FOR SHORTS AND/OR OPENS; TESTS SEMICONDUCTOR DEVICES FOR LEAKAGE,SHORTS AND OPEN BONDING,TO INCLUDE ZENEC DIODES,BIPOLAR TRANSISTOR,TRIACS,AND OPTOELECTRONIC DEVICES; TESTS INTEGRATED CIRCUITS FOR COMPONENT FAILURE; W/THREE SELECTABLE IMPEDANCE RANGES AND OUTPUT FREQUENCY RANGES; OPERATED FROM 115/120 VOLTS,50/60 HZ,SINGLE PHASE; W/PROTECTION COVER OR CARRYING CASE; DESIGNED TO TEST UNPOWERED CIRCUITS AND DEVICES IN MAINTENANCE SUPPORT OF MEDICAL EQUIPMENT
ZZZWDEPARTURE FROM CITED DOCUMENTPEACETIME DEMAND OBTAIN
CXCYIII PART NAME ASSIGNED BY CONTROLLING AGENCYTEST SET ELECTRONIC 115/120V 50/60 HZ SGL PHASE W/CASE OR COVER

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