MRC | Criteria | Characteristic |
---|
ADAQ | BODY LENGTH | 1.270 INCHES MINIMUM AND 1.290 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.590 INCHES MINIMUM AND 0.610 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.205 INCHES MINIMUM AND 0.225 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND PROGRAMMED AND HIGH SPEED AND TESTED TO MIL-STD-883 AND BURN IN, MIL-STD-883, CLASS B AND HERMETICALLY SEALED AND 3-STATE OUTPUT |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-3 MIL-M-38510 |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 0.0 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
CZEQ | TIME RATING PER CHACTERISTIC | 55.00 NANOSECONDS MAXIMUM ACCESS |
CZER | MEMORY DEVICE TYPE | PROM |
TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
ZZZK | SPECIFICATION/STANDARD DATA | 95105-210-2104-010 MANUFACTURERS SPECIFICATION CONTROL |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,DIGITAL,MEMORY |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
AFJQ | STORAGE TEMP RANGE | -65.0/+150.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | PACER SPECIAL |
NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
CZZZ | MEMORY CAPACITY | 32768 X 4096 |
FEAT | SPECIAL FEATURES | ESD; ALTERED ITEM PROGRAMMED (USING 34335/AM27S43A/BJA OR 18234/82HS321A/BJA OR MMI/53S3281AJ/883B) USING FILE MPMU20.HEX WITH CHECKSUM 2170. CRIT CODE CHG (H) PER ES LONNELL MAY 01/06 |